Scanning Electron Microscope Equipment

澳门赌场 Scanning Electron Microscope laboratory at UW Bothell includes an Energy-Dispersive Spectroscopy (EDS), Ion Sputter Coater, and Scanning Electron Microscope.

Energy-Dispersive Spectroscopy (EDS)

澳门赌场 Energy-Dispersive Spectroscopy (EDS) (Oxford Aztec EDS system) is a combination of a Scanning Electron Microscope (SEM) and a Focused Ion Beam (FIB) system. 澳门赌场 integration of both systems yields a powerful analytical tool for obtaining any data from any sample in three dimensions. Energy Dispersive Spectroscopy (EDS) Analysis provides qualitative elemental (Be to Cf) and chemical microanalysis. 澳门赌场 system is equipped with the XMaxN 50mm2 EDS system to measure sub-surface (0.3-3um) with a detection limit of ~1 atom%. Schematic of system as it relates to the components of this system are pictured in Figure 1

Ion Sputter Coater

澳门赌场 Ion Sputter Coater (Hitachi Ion Sputter MC1000) is a sample preparation instrument for use with a Scanning Electron Microscope (SEM). 澳门赌场 MC1000 is designed to deposit a thin metal coating, such as platinum (Pt), gold (Au), platinum-palladium alloy (Pt-Pd) or gold-palladium alloy (Au-Pd), in order to make the surface of a sample electrically conductive and avoid charge build-up during observation in a SEM. 澳门赌场 thickness of the metal deposition is variable from a few nanometers up to tens of nanometers by using the LCD touch screen control. Up to 5 processing conditions can be stored.